📝 SummarXiv

Abstract

Under a sufficiently high applied electric field, a non-polar antiferroelectric material, such as \ce{PbZrO3}, can undergo a rapid transformation to a polar ferroelectric phase. While this behavior is promising for energy storage and electromechanical applications, a complete understanding of the atomic-scale mechanisms governing the phase transition remain elusive. Here, we employ \textit{operando} scanning transmission electron microscopy electric field biasing to directly resolve the antiferroelectric-to-ferroelectric transition pathway in \ce{PbZrO3} thin films under device-relevant conditions. Atomic-resolution imaging reveals a multi-step transition that includes several metastable phases. Complementary nano-beam electron diffraction and atomic scale analysis further show that this pathway and its end states can be modulated, leading to the formation of a \quotes{dead layer} near the substrate with suppressed switching behavior. Taking advantage of this depth-dependent heterogeneity, dynamic phase transformations are observed between coexisting antiferroelectric and metastable ferroelectric phases. At this dynamic transition front, repeated phase interconversion is shown to be driven by competing internal (due to substrate clamping and extended defects) and external fields, allowing the relative energies of intermediate phases to be compared as a function of electric field. This work highlights the critical role of local energetics in phase stability and provides key experimental insights into field-induced phase transitions, guiding the design of antiferroelectric-based devices.