📝 SummarXiv

Abstract

Microscopy is an essential tool in imaging research, and the edge-enhanced microscope by using the vortex filter is of particular interest as an optical information processing that highlights amplitude and phase edges of object in all directions. The application of this technique is not limited to the visible range, but edge enhancement of object in invisible wavelength is also crucial for near-infrared fluorescence and electronic circuit inspection through silicon semiconductors. One disadvantage of near-infrared imaging is that digital cameras such as CCD and CMOS become much more expensive than cameras for the visible spectrum. As an cost-effective method to implement invisible edge enhancement, the Fourier single-pixel imaging has already been proposed without using a camera, but using a single-pixel detector. However, this method requires 3 or 4 times more single-pixel measurements due to the three-phase or four-phase shift to detect optical complex amplitude in Fourier domain. In response, we propose a method for single-pixel edge enhancement of object via convolutional filtering with a localized vortex phase, eliminating the extra single-pixel measurements required by the phase-shifting method. Our simulation results show that the correlation coefficient between the ideal edges of an object and the edge enhanced by our proposed method is 0.95, indicating that our method is effective way to detect the edges. This novel and effective approach for enhancing and detecting the edges of object can be valuable in various invisible imaging applications.