📝 SummarXiv

Abstract

Few-layer $\alpha$-In$_2$Se$_3$ has been studied under pressure using Raman spectroscopy in a diamond anvil cell up to 60 GPa (at room temperature). A combination of AFM and Raman was used to estimate the thickness of the specimens. While few-layer $\alpha$-In$_2$Se$_3$ shows identical structural evolution with the one of the bulk powder-like form of $\alpha$-In$_2$Se$_3$ ( $\alpha$ $\rightarrow$ $\beta^{'}$ $\rightarrow$ IV ), an abrupt $\beta^{'}$ $\rightarrow$ IV phase transition (at 45 GPa) was observed, in contrast with the case of the bulk specimen where the two phases coexist over a wide pressure range. This is attributed to the difference in specimens morphology, $i.e.$ single crystal and powder in the case of few-layer and bulk $\alpha$-In$_2$Se$_3$, respectively. This study documents the significance of specimens morphology on the observed pressure-induced phase transitions. The methodology developed in this study for performing high-pressure Raman measurements can be applied to other nanodimensional layered materials.