📝 SummarXiv

Abstract

Two-level systems (TLSs) are tunneling states commonly found in amorphous materials that electrically couple to qubits, resonators, and vibrational modes in materials, leading to energy loss in those systems. Recent studies suggest that applying a large alternating electric field changes the oxide structure, potentially improving the performance of qubits and resonators. In this study, we probe the effect of alternating bias at cryogenic temperatures on TLS dynamics within amorphous oxide parallel-plate capacitors operating in the strongly coupled regime. We bias the TLSs in the capacitors using an electric field. This allows us to spectroscopically image TLSs and extract their densities and dipole moments. When an in-situ alternating bias is applied, the steady-state spectra from the standard TLS model disappear. Post-alternating bias TLS spectroscopy reveals transient behavior, in which the TLS frequency fluctuates on the order of minutes. Thermal cycling above 10 K reverses these effects, restoring the TLS spectrum to its original state, indicating a reversible mechanism. Importantly, the intrinsic loss tangent of the LC oscillator remains unchanged before and after the application of the alternating bias. We propose that the disappearance of the steady-state spectrum are caused by non-equilibrium energy build up from strain in the oxide film introduced by the pulsed voltage bias sequence. Understanding this non-equilibrium energy could inform future models of time-dependent TLS dynamics.