High-resolution electric field imaging based on intermittent-contact mode scanning NV center electrometry
Zhi Cheng, Zhiwei Yu, Mengqi Wang, Lingfeng Yang, Zihao Cui, Ya Wang, Pengfei Wang
Published: 2025/9/15
Abstract
Scanning nitrogen-vacancy (NV) center electrometry has shown potential for quantitative quantum imaging of electric fields at the nanoscale. However, achieving nanoscale spatial resolution remains a challenge since employing gradiometry to overcome electrostatic screening causes resolution-limiting trade-offs including the averaging effect and the sensor-sample proximity. Here, we demonstrate a scanning NV center protocol that achieves an enhanced spatial resolution of approximately 10 nm. We develop an axially symmetric probe with a sub-nanometer oscillating amplitude, which simultaneously provides robust intermittent-contact mode feedback and ensures close engagement between the diamond tip and the sample. As an example, we experimentally demonstrate a 10 nm spatial resolution on ferroelectric lithium niobate. Scanning NV center electrometry with this resolution can directly resolve the nanoscale polar textures and dynamics of emerging ferroelectrics, which commonly arise on the scale of tens of nanometers.