Inline calibration of spatial light modulators in nonlinear microscopy
Daniël W. S. Cox, Harish Sasikumar, Ivo M. Vellekoop
Published: 2025/5/28
Abstract
We present a method for calibrating the response of a phase-only spatial light modulator in nonlinear microscopy. Our method uses the microscope image itself as calibration measurement and requires no additional hardware components. Our method is adapted to the nonlinear signals encountered in multi-photon excitation fluorescence microscopes, and works well even under low light conditions and with strong photobleaching.