A defect-chemistry-informed phase-field model of grain growth in oxide ceramics: application to Fe-doped SrTiO3

Kai Wang, Roger A. De Souza, Xiang-Long Peng, Rotraut Merkle, Wolfgang Rheinheimer, Karsten Albe, Bai-Xiang Xu

Published: 2024/7/24

Abstract

Dopants can significantly affect the properties of oxide ceramics through their impact on the property-determined microstructure characteristics such as grain boundary (GB) segregation, space charge layer formation in the GB vicinity, and the grain growth deviating from normal patterns. To support the rational design of oxide ceramics, we propose a defect-chemistry-informed phase-field grain growth model to simulate the microstructure evolution of oxide ceramics. It fully respects the defect-chemistry theory by accounting for the distinct segregation energies and available site densities of charged point defects (oxygen vacancies and acceptor dopants) in both the grain interior and boundaries, and it considers the competing kinetics of defect diffusion and GB movement. The proposed phase-field model is benchmarked against well-known bicrystal models, including the Mott-Schottky and Gouy-Chapman models. Various simulation results are presented to reveal the effect of different defect-chemistry parameters on the space charge layer formation and key microstructural aspects. In particular, simulation results confirm that the solute drag effect alone can lead to skewed grain size distribution that do not follow the log-normal distribution, without any contribution from grain misorientation and other anisotropy. Interestingly, simulations also demonstrate that grain boundary potentials can vary substantially: GBs of larger grains tend to have lower potentials than those of smaller grains. Such heterogeneous GB potential distribution may inspire a new material optimization strategy through microstructure design. This study provides a comprehensive framework for defect-chemistry-consistent investigations of microstructure evolution in polycrystalline oxide ceramics, offering fundamental insights into microscopic processes during critical manufacturing stages.

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